This book presents the art of advanced MOSFET modeling for integrated circuit simulation and design. It provides the essential mathematical. BSIM and IC simulation. Circuit simulation and compact models. BSIM – the beginning. BSIM3 – a compact model based on new MOSFET physics. : BSIM4 and MOSFET Modeling for IC Simulation (International Series on Advanced in Solid State Electronics and Technology).

Author: Yozshuzragore Tot
Country: Oman
Language: English (Spanish)
Genre: Life
Published (Last): 28 May 2013
Pages: 192
PDF File Size: 12.32 Mb
ePub File Size: 2.36 Mb
ISBN: 673-8-34307-490-6
Downloads: 15474
Price: Free* [*Free Regsitration Required]
Uploader: Daizragore

Imprint Singapore ; Hackensack, N. Velocity saturation and velocity overshoot. BSIM4 diode charge and capacitance [4].

BSIM4 junction leakage due to trap-assisted tunneling [4]. It provides the essential mathematical and physical analyses of all the electrical, mechanical and thermal effects in MOS transistors relevant to the operation of integrated circuits. Skip to search Skip to main content. Source and drain area and perimeter calculation.

Connections of a multi-transistor simulaion.

SearchWorks Catalog

Publication date Series International series on advances in solid state electronics and technology Reproduction Electronic reproduction. Junction diode IV and CV models. Composite stamps for transient NQS model. Time discretization, equation linearization and matrix stamping.


BSIM4 and MOSFET Modeling for IC Simulation – Weidong Liu, Chenming Hu – Google Books

Review of the charge-deficit transient NQS model. BSIM – the beginning. Channel DC current and output resistance. BSIM4 – aimed for nm down to 20nm nodes. Physical description xix, p. BSIM4 channel thermal noise models. ISBN electronic bk. World Scientific Full view. Responsibility Weidong Liu, Chenming Hu.

Gate intrinsic-input resistance for non-quasi-static modeling. Find it at other libraries via WorldCat Limited preview. Source and drain of a transistor with multiple gate fingers. Gate direct-tunneling and body currents. Saturation junction leakage current and zero-bias capacitance simulatioj. Gate direct-tunneling current theory and model.

Noise representations and moreling.

Charge and capacitance models. Output resistance in saturation region. Available to subscribing institutions. Describe the connection issue. Channel current in subthreshold and linear operations.

SearchWorks Catalog Stanford Libraries. Non-quasi-static and parasitic gate and body resistances. Introduction and chapter objectives. Gate and channel geometries and materials. World Scientific Publishing Co.

The intent of this book ch. Nielsen Book Data Bibliography Includes bibliographical references and index.


BSIM4 and MOSFET modeling for IC simulation – CERN Document Server

Single continuous channel charge model. Special attention is paid to MOSFET characterization and model parameter extraction methodologies, making the book particularly useful modfet those interested or already engaged in work in the areas of semiconductor devices, compact modeling simulwtion SPICE simulation, and integrated circuit design. Diode temperature-dependence model [4].

Physical mechanisms of diode DC currents. The discussion covers the theory and methodology of how a MOSFET model, or semiconductor device models in general, can be implemented to be robust and efficient, turning device physics theory into a production-worthy SPICE simulation model.

Source and drain contact scenarios and diffusion resistances. Source and drain parasitics: Intrinsic charge and capacitance models. BSIM4 flicker noise models. Fringing and overlap capacitances. Series International series on advances in solid state electronics and technology.