Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].
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Digital Circuit Testing and Testability by Parag K. Lala
Extensive references follow each chapter, making further research in a particular area readily available. Nani rated it did not like it Dec 14, Digital circuit testing and testability by Parag K. Goodreads helps you keep track of books you want to read.
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Digital Circuit Testing and Testability
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Faults in Digital Circuits — Ch. Finding libraries that hold this item Want to Read Currently Reading Read.
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Copy and paste this code into your Wikipedia page. This text reviews many different techniques and methodologies to show how to design systems that are fault tolerant. Don’t have an account? Thanks for telling us about parab problem. Access Online via Elsevier Amazon.
Digital circuit testing and testability
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